Hardness-assurance and testing issues for bipolar/BiCMOS devices
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چکیده
منابع مشابه
Testing and Hardness Assurance Guidelines for Single Event Transients (SETs) in Linear Devices
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ژورنال
عنوان ژورنال: IEEE Transactions on Nuclear Science
سال: 1993
ISSN: 0018-9499,1558-1578
DOI: 10.1109/23.273492